AOI-TZ170-COS是针对激光芯片产品外观检测以及端面清洗的精密设备，检测方式采用机器视觉检测，清洗方式使用环保高效的二氧化碳雪花清洗。

AOI-TZ170-COS is a precision system specifically designed for comprehensive visual inspection and end-face cleaning of laser chips. The system incorporates machine vision technology for defect detection and employs an environmentally friendly, high-efficiency carbon dioxide snow cleaning mechanism.

设备具有自动供、收料机构，分选机构根据相机成像的图形结果进行缺陷特征识别，并通过特定算法对缺陷进行判断并分类，从而实现激光芯片产品的自动化检测功能,包括检测脏污、端面破损、镀膜异色、裂纹、磨痕、白色纹路、区域异色、小黄点、小白点、等外观瑕疵。

This advanced equipment features an automated material handling system with integrated feeding and collection mechanisms. The sorting module utilizes image processing algorithms to identify and classify defect characteristics based on camera-captured patterns, enabling fully automated inspection of laser chip products. The system is capable of detecting various surface anomalies including:

Contamination

End-face damage

Coating discoloration

Cracks

Grinding marks

White streaks

Regional discoloration

Micro yellow spots

Micro white spots

检测项目包含N面、P面、AR、HR。通过一系列的检测，最后输出报表，可自由配置检测标准、检测方法、支持用户自定义AI计算，可以无缝对接MES系统，提供多种报表导入导出。

The inspection process covers multiple critical surfaces: N-face, P-face, AR (Anti-Reflection) coating, and HR (High-Reflection) coating. The system generates comprehensive inspection reports with configurable detection standards and methodologies. It supports user-defined AI algorithms and provides seamless integration with MES (Manufacturing Execution System) through multiple data import/export formats.

设备有较强的稳定性，定位精准，检出率高。采用高强度钢架构，以及大理石底座，确保设备在搬运过程中，成像稳定。

Engineered for industrial reliability, the system demonstrates exceptional stability and positioning accuracy with high defect detection rates. Its robust construction features a high-strength steel frame coupled with a granite base, ensuring imaging stability during equipment relocation and operation.