AOI-NM170设备主要用于COS芯片的全自动视觉检测分选，采用先进的基于人工智能AI的机器视觉检测技术和自主创新机构设计。

AOI-NM170 is mainly used for fully automatic visual inspection and sorting of COS chips, adopting advanced machine vision inspection technology based on artificial intelligence AI machine vision inspection technology and independent innovation.

AOI-NM170可全方位检测COS的出光面（AR）、反光面（HR）、P面、N面。解决了基板反光，焊接干扰等行业痛点，突破了白纹、镀膜小点等外观瑕疵检测的行业瓶颈；

AOI-NM170 can achieve all-round detection of the emitting surface(AR), reflective surface (HR),P-side, and N-side of COS chip. Solved industry pain points such as substrate reflection,welding interference,etc., and broke through industry bottlenecks indetecting appearance defects such as white lines and coated spots.

采用独创AI算法，达到最佳检测效果；

Adopting original Al algorithm to achieve the best detection effect. Supports automatic chip identification(chip size, position, ID number, and other information), automatic focusing, positioning, picking, detection, product height detection, and other functions.

支持芯片的自动识别（芯片尺寸、位置、ID号等信息）、自动聚焦、定位、拾取、检测、产品高度检测等功能；自主创新机构设计，采用纳米级运动控制平台，有效保证了检测精度，大幅提升了检测效率；

Independently innovative mechanism design, adopting a nanoscale motion control platform, effectively ensuring detection accuracy and significantly improving detection efficiency.