AOI-TZ170设备用于COS芯片/BAR条的全自动检测与分选，这款设备具有高度灵活性, 可根据客户需求高度定制，满足工业客户大批量生产需求。

AOI-TZ170 is used for fully automatic inspection and sorting of COS chips/BAR, which is highly flexible and can be highly customized to meet the needs of industrial customers for mass production.

AOI-TZ170在检测COS芯片/BAR条精度上有着自主创新，突破国外技术的封锁。其检测精度已经达到0.17μm，机器能够检测除超过0.5μm以上的芯片缺陷，目前已领先于行业；

AOl-TZ170 has independent innovation in detecting the accuracy of COS chips/BAR, breaking through the blockade of foreign technology. Its detection accuracy has reached 0.17μm, the machine is able to detect more than 0.5μm chip defects, has led the industry.

AOI-TZ170在算法上采用了基本图层与AI图层功能相结合，实现了最佳检测效果，同时还拥有自动识别技术（自动拾取、定位、聚焦、检测等一系列功能）；

AOl-TZ170 adopts a combination of basic layer and Al layer functions in its algorithm to achieve the best detection effect, and also has automatic identification technology (a series of functions such as automatic picking, positioning, focusing, detection, etc.)

AOI-TZ170采用了自动供收料结构。与堆叠式料仓，实现了上下料自动衔接，大大缩减了上下料时间，提高了在检测过程中的运行效率；

AOl-TZ170 adopts automatic supplying and receipting structure. With stacked silos, it realizes the automatic connection of loading and unloading, which greatly reduces the loading and unloading time and improves the operation efficiency during the inspection process.

▪ 检测精度：170nm/pixel（最高兼容34nm）

Detection accuracy: 170nm/pixel (up to 34nm compatible)

▪ 检测准确率：≥ 99.8%

Detection precision: ≥ 99.8%

▪ 检测缺陷种类：表面污染、镀膜异常、刮伤、断裂、镀膜异色、漏头尺寸、焊料外溢等

Types of Detection Defects：Surface contamination, abnormal coating, scratches, fractures, coating heterochromia, leakage head size, solder spillage, etc.